DEVICE PARAMETERS EFFECT ON SOME MEMORY CHARACTERISTICS OF DIFFERENT METAL-NITRIDE-OXIDE- SEMICONDUCTOR (MNOS) STRUCTURES

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DEVICE PARAMETERS EFFECT ON SOME MEMORY CHARACTERISTICS OF DIFFERENT METAL-NITRIDE-OXIDE- SEMICONDUCTOR (MNOS) STRUCTURES

ABDUL-GHEFAR KAMIL FAIQ - Personal Name;

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College of Education 530 F342

530F3421

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Series Title: -
Call Number: 530 F342
Publisher: Erbil : SALAHADDIN UNIVERSITY., 1999
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Language: English
ISBN/ISSN: -
Classification: 530
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Carrier Type: volume
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