SOC (System‑on‑a‑Chip) Testing for Plug and Play Test Automation

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SOC (System‑on‑a‑Chip) Testing for Plug and Play Test Automation

Krishnendu Chakrabarty (Editor) - Personal Name;

This edited volume brings together research on testing methodologies for System‑on‑Chip (SoC) designs, focusing on plug‑and‑play test automation, standards such as IEEE P1500, test access mechanisms, data compression, and signal integrity considerations. Originally part of a special issue of the Journal of Electronic Testing, it serves as a key resource for engineers and researchers in SoC test and verification.

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College of Education 621 C426

621C4261

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Detail Information

Series Title: Frontiers in Electronic Testing, Volume 21
Call Number: 621 C426
Publisher: Boston, Massachusetts, USA : KLUWER ACADEMIC PUBLISHERS., 2002
Collation: ~208 pages; includes bibliographical references; illustrations.
Language: English
ISBN/ISSN: 1-4020-7205-8
Classification: 621
Content Type: text
Media Type: unmediated
Carrier Type: volume
Edition: 1st edition
Subject(s): • System‑on‑Chip (SoC) testing • Plug and Play tes
Specific Detail Info: Contains specialized research articles on SoC test automation, including methodologies, standards, and access mechanisms.
Statement of Responsibility: Edited by Krishnendu Chakrabarty

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