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Growth and Characterisation of SemiconductorsGrowth and Characterisation of Semiconductors

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Based on advanced course material from the London University Interdisciplinary Research Centre for Semiconductor Materials, this volume reviews modern methods for growing and characterizing low-dimensional semiconductor structures. It covers epitaxial techniques, thin-film analysis, defect characterization, and electrical/optical measurement methods. Intended for graduate students and researchers in physics, materials science, and electrical engineering

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Detail Information

Series Title

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Call Number

Dewey Decimal: 621.381/52 Biblio 3 eBay 3 Bibli

Publisher

Bristol, UK (also North Americ : Adam Hilger Ltd. (Taylor & Francis), Bristol (also Philadelphia & New York)., 1989 (distributed 19

Collation

Bristol, UK (also North American distribution)

Language

English

ISBN/ISSN

0-85274-131-6

Classification

Dewey Decimal: 621.381/52 Biblio 3 eBa

Content Type

-

Media Type

-

Carrier Type

volume

Edition

First Edition, 1989 (published 1990)

Subject(s)

Electromagnetism Electromagnetic waves Applied p
Semiconductor epitaxy and crystal growth Thin fil

Specific Detail Info

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Statement of Responsibility

edited by R. A. Stradling and P. C. Klipstein

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